Smart Multi-Bin Sorting
Mi Series
- ✔ Wafer to Wafer Platform
- ✔ Design to enable Multiple Bin Sorting - up to 10 bins!
- ✔ Multiple Output Cassettes format to cater for multiple bin sorting efficiency
- ✔ 6S Advanced Sensor and Display level AOI available!
- ✔ Industrial Automation ready - incorporating auto wafer cassette handling
- ✔ Thin die capability
- ✔ Class 100
ALS/ToF Test Handler
Si Series
- ✔ Design to enable Sensor Testing with external stimuli
- ✔ Multiple types of stimulus test (e.g. white light, proximity, cross-talk) available at one go, with one pick and place to improve testing reliability & capability and improve output efficiency
- ✔ Multi-test configuration available
- ✔ High UPH
- ✔ Tray input - protect sensor. Bowl feed input as option
- ✔ Tape and reel output, with reject bin and tray
- ✔ 6 Sides inspection available with Sensor inspection as option
- ✔ High Temperature option available!